Christina Mastrangelo holds BS, MS and Ph.D. degrees in Industrial Engineering from Arizona State.   She has several years of industrial manufacturing experience at AlliedSignal Aerospace, Honeywell IACD and Ion Implant Services.   Dr. Mastrangelo has published over 20 journal papers in the area of empirical stochastic modeling and statistical process monitoring.   One of the papers received the Ellis R. Ott Award for significant contribution to the field of quality engineering.   She is a member of ASA, ASQ, INCOSE, INFORMS, WEPAN, and a senior member of IIE.

Dr. Mastrangelo's primary research field is quality engineering and empirical stochastic modeling.   Her research interests include the areas of robust product design, multivariate quality control, statistical monitoring methods for continuous and batch processing, statistical process control with autocorrelated data, multi-response modeling, and operational modeling for semiconductor manufacturing.

Sponsored Research:

• Hierarchical Modeling of Yield and Defectivity to Improve Factory Operations (funded by the National Science Foundation)
• CAREER: Multivariate Monitoring of Dynamic Systems (funded by the National Science Foundation)
• Data Mining for Multivariate Monitoring Applications (funded by AbTech Inc.)
• FTP Decision Support System (funded by Capital One)
• Optimization of an IT Work Order System (funded by Capital One)
• Automatic Defect Classification of Die Sort Wafer Maps (funded by Dominion Semiconductor)